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ELECTRICAL CHARACTERIZATION OF LASER/ENERGY-BEAM RECRYSTALLIZED THIN FILM SILICON-ON-INSULATOR (SOI)

著者名:
掲載資料名:
Comparison of thin film transistor and SOI technologies : symposium held February 1984 in Albuquerque, New Mexico, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
33
発行年:
1984
開始ページ:
139
終了ページ:
146
総ページ数:
8
出版情報:
New York: North Holland
ISSN:
02729172
ISBN:
9780444008992 [0444008993]
言語:
英語
請求記号:
M23500/33
資料種別:
国際会議録

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