1.

国際会議録
国際会議録
1. Steady-State and Time Resolved Luminescence Studies of Strained (Al,Ga,In)AsP/Ga0.52In0.48P Heterointerfaces
Arent, D.J. ; Kocha, S.S. ; Peterson, M.W ; Rosenwaks, Y. ; Gruenbaum, E. ; Turner, J.A.
出版情報: Proceedings of the Symposium on Wide Bandgap Semiconductors and Devices and the Twenty-Third State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXIII).  pp.285-306,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-21
2.

国際会議録
国際会議録
2. NANOSCALE ELECTRONIC MEASUREMENTS OF SEMICONDUCTORS USING KELVIN PROBE FORCE MICROSCOPY
Rosenwaks, Y. ; Shikler, R.
出版情報: Scanning probe microscopy : characterization, nanofabrication and device application of functional materials.  pp.119-152,  2005.  Dordrecht.  Kluwer Academic Publishers
シリーズ名: NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号: 186
3.

国際会議録
国際会議録
3. High-voltage atomic force microscopy: a new technology for nanoscale optical devices (Invited Paper)
Rosenwaks, Y. ; Molotskii, M. ; Agronin, A. ; Urenski, P. ; Rosenman, G.
出版情報: Nanotechnology.  pp.213-220,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5118