1.

国際会議録
国際会議録
1. Optical characterization of carbon ion implantation into Si and SiGe alloys (Invited Paper)
Perez-Rodriguez,A. ; Romano-Rodriguez,A. ; Serre,C. ; Calvo-Barrio,L. ; Gonzalez-Varona,O. ; Morante,J.R.
出版情報: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.324-333,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3359
2.

国際会議録
国際会議録
2. In-situ HVEM study of dopant dependent defect generation in silicon during I MeV electron irradiation
Romano-Rodriguez,A. ; Vanhellemont,J.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.303-308,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
3.

国際会議録
国際会議録
3. Effect of stress on defect transformation in hydrogen-implanted silicon and SOI structures
Antonova,J.V. ; Popov,V.P. ; Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Obodnikov,V.I. ; Gutakovskii,A.K. ; Romano-Rodriguez,A.
出版情報: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  pp.120-125,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4412