1.

国際会議録
国際会議録
1. Far-infrared photoconductor arrays for Herschel and SOFIA (Invited Paper)
Poglitsch, A. ; Katterloher, R.O. ; Hoenle, R. ; Beeman, J.W. ; Haller, E.E. ; Richter, H. ; Groezinger, U. ; Haegel, N.M. ; Krabbe, A.
出版情報: Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA.  pp.115-128,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4855
2.

国際会議録
国際会議録
2. INTRODUCTORY REMARKS -- PROCESS MODELING
Mertens, P. ; Richter, H.
出版情報: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.455-457,  2002.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2002-2
3.

国際会議録
国際会議録
3. CURRICULUM VITAE OF OXIDE PRECIPITATES: FROM NUCLEATION DURING CRYSTAL GROWTH TO THEIR FINAL DESTINATION IN PROCESSED WAFERS
Kissinger, G. ; Vanhellemont, J. ; Lambert, U. ; Dornberger, E. ; Sorge, R. ; Morgenstern, G. ; Grabolla, T. ; Graef, D. ; von Ammon, W. ; Wagner, P. ; Richter, H.
出版情報: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1095-1112,  1998.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-1(2)
4.

国際会議録
国際会議録
4. Evaluating and implementing H.264 for embedded and mobile streaming applications
Richter, H. ; Stabernack, B. ; Mueller, E.
出版情報: Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA.  pp.490-498,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5203
5.

国際会議録
国際会議録
5. Oxygen Precipitation and Stacking Fault Formation in Wafers with a Transition from Vacancy-Rich to Interstitial-Rich
Kissinger, G. ; Morgenstern, G. ; Grabolla, T. ; Richter, H. ; Vanhellemont, J. ; Lambert, U. ; Graef, D.
出版情報: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.158-169,  1998.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-13
6.

国際会議録
国際会議録
6. Investigation of crystal defects in as-grown and processed silicon wafers and heteroepitaxial layers by infrared light scattering tomography
Kissinger, G. ; Vanhellemont, J. ; Graef, D. ; Zulehner, W. ; Claeys, C. ; Richter, H.
出版情報: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.156-164,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-30
7.

国際会議録
国際会議録
7. Grown-in oxide precipitate nuclei in Czochralski silicon substrates and their role in device processing
Kissinger, G. ; Grabolla, T. ; Morgenstern, G. ; Richter, H. ; Graef, D. ; Vanhellemont, J. ; Lambert, U. ; von Ammon, W.
出版情報: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.74-87,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-22
8.

国際会議録
国際会議録
8. D-defects and metal-related flow patterns
Kissinger, G. ; Morgenstern, G. ; Richter, H. ; Vanhellemont, J. ; Graef, D. ; Lambert, U. ; von Ammon, W. ; Wagner, P.
出版情報: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.32-39,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-22
9.

国際会議録
国際会議録
9. Superconducting hot-electron bolometer as mixer for far-infrared heterodyne recievers
Huebers, H.-W. ; Semenov, A. ; Richter, H. ; Birk, M. ; Krocka, M. ; Mair, U. ; Smirnov, K. ; Gol'tsman, G.N. ; Voronov, B.M.
出版情報: Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA.  pp.395-401,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4855
10.

国際会議録
国際会議録
10. Characterization of high- and low-stressed Ge:Ga array cameras for Herschel's PACS instrument
Birkmann, S. M. ; Eberle, K. ; Grozinger, U. ; Lemke, D. ; Schreiber, J. ; Barl, L. ; Katterloher, R. ; Poglitsch, A. ; Schubert, J. ; Richter, H.
出版情報: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.437-447,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5487