Haddab, Y. ; Mosser, V. ; Lysowec, M. ; Suski, J. ; Demeus, L. ; Renaux, C. ; Adriensen, S. ; Flandre, D.
出版情報:
Noise and Information in Nanoelectronics, Sensors, and Standards. pp.196-203, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering