1.

国際会議録
国際会議録
1. Stress-induced effects in semiconducting epitaxial layers
Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Kaniewski,J. ; Adamczewska,J. ; Trela,J. ; Reginski,K. ; Dobosz,D. ; Prujszczyk,M. ; Tedenac,J.C.
出版情報: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.262-266,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4413
2.

国際会議録
国際会議録
2. Advanced InGaAs detectors on GaAs substrates
Kaniewski,J. ; Orman,Z. ; Piotrowski,J. ; Reginski,K. ; Romanis,M.
出版情報: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.749-759,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4130
3.

国際会議録
国際会議録
3. Defect related recombination processes in low-dimensional structures of ZnCdSe/ZnSe,CdTe/CdMnTe and GaAs/AlGaAs
Godlewski,M. ; Hommel,D. ; Wojtowicz,T. ; Karczewski,G. ; Kossut,J. ; Reginski,K. ; Bugajski,M. ; Bergman,J.P. ; Monemar,B.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1665-1670,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
4.

国際会議録
国際会議録
4. Reciprocal lattice mapping of InGaAs Layers grown on InP(001)and GaAs(001)substrates
Bak-Misiuk,J. ; Kaniewski,J. ; Domagata,J. ; Reginski,K. ; Adamczewska,J. ; Trela,J.
出版情報: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.47-52,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3725
5.

国際会議録
国際会議録
5. GaAs/AIGaAs complex structures examined by photoreflectance spectroscopy
Sek,G. ; Misiewicz,J. ; Kaniewska,M. ; Reginski,K. ; Muszalski,J.
出版情報: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.137-140,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3179
6.

国際会議録
国際会議録
6. GRIN SCH SQW AIGaAs/GaAs lasers grown by molecular beam epitaxy:modeling and operating characteristics (Invited Paper)
Bugajski,M. ; Kaniewska,M. ; Reginski,K. ; Malag,A. ; Lepkowski,S. ; Muszalski,J.
出版情報: Laser Technology V: Physics and Research and Development Trends.  pp.310-323,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3186