1.

国際会議録
国際会議録
1. DETECTION OF MISFIT STRAIN RELAXATION IN MBE GROWN Si1-XGe FILMS BY DYNAMIC MONITORING OF RHEED DIFFRACTION FEATURES
Maes, J. W. ; Schannen, O. F. Z. ; Trommel, J. ; Werner, K. ; Radelaar, S. ; Balk, P.
出版情報: Mechanisms of Heteroepitaxial growth : symposium held April 27-30, 1992, San Francisco, California, U.S.A..  pp.427-432,  1992.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 263
2.

国際会議録
国際会議録
2. DEPOSIT OF TUNGSTEN ON SILICON DIOXIDE BY GeH4 REDUCTION OF WF6
Oosterlaken, T. G. M. ; Luisink, G. J. ; van der Leugd, C. A. ; Janssen, G. C. A. M ; Radelaar, S.
出版情報: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.93-98,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 260
3.

国際会議録
国際会議録
3. Floating Wafer Reactor: RTP Based on Thermal Conductive Heat Transfer
Kuznetsov, V.I. ; Radelaar, S. ; Granneman, E.A.H.
出版情報: Advances in rapid thermal processing : proceedings of the symposium.  pp.391-398,  1999.  Pennington, N. J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-10
4.

国際会議録
国際会議録
4. Mechanical Behavior of AlNiCr Blanket Films and Stacks of Films During Thermal Cycling
Lokker, J.P. ; Janssen, G.C.A.M. ; Radelaar, S.
出版情報: ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology.  pp.371-384,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-3
5.

国際会議録
国際会議録
5. EVOLUTION OF INTRINSIC STRESS DURING NUCLEATION AND GROWTH OF POLYCRYSTALLINE TUNGSTEN FILMS BY CHEMICAL VAPOR DEPOSITION
Leusink, G. J. ; Oosterlaken, T. G. M. ; Janssen, G. C. A.M. ; Radelaar, S.
出版情報: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.139-144,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 239
6.

国際会議録
国際会議録
6. IN SITU STRESS MEASUREMENTS DURING THE FORMATION OF TiSi2 C49 ON Si WAFERS
Jongste, J. F. ; Janssen, G. C. A. M. ; Radelaar, S.
出版情報: Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A..  pp.61-66,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 188
7.

国際会議録
国際会議録
7. IN SITY MONITORING OF THE SMEAR-OUT OF THE Ge PROFILE IN GAS SOURCE SiGe MBE USING RHEED INTERNSITY OSCILLATIONS
Werner, K. ; Butzke, S. ; Maes, J W.. ; Schannen, O. F. Z. ; Trommel, J. ; Radelaar, S. ; Balk, P.
出版情報: Mechanisms of Heteroepitaxial growth : symposium held April 27-30, 1992, San Francisco, California, U.S.A..  pp.261-266,  1992.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 263
8.

国際会議録
国際会議録
8. SELECTIVE CHEMICAL VAPOUR DEPOSITION OF TUNGSTEN USING SiH4WF6 CHEMISTRY
van der Jeugd, C.A. ; Verbruggen, A.H. ; Leusink, G.J. ; Janssen, G.C.A.M. ; Radelaar, S.
出版情報: Chemical vapor deposition of refractory metals and ceramics : symposium held November 29-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.179-184,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 168
9.

国際会議録
国際会議録
9. W and WSi-2 Deposition by the Reaction of Poly-Crystalline Si and WF6
Schaffnit, C. ; Sabuoret, E. ; Van der Jeugd, C.V. ; Oosterlaken, T.G.M. ; Jansen, G.C.A.M. ; Radelaar, S.
出版情報: Proceedings of the Symposium on Interconnect and Contact Metallization.  pp.47-55,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-31
10.

国際会議録
国際会議録
10. Electromigration in Short Al Lines Studied by High-Resolution Resistance Measurement
Verbruggen, A. H. ; Homberg, M. J. C. van den ; Jacobs, L. C. ; Kalkman, A. J. ; Kraayeveld, J. R. ; Radelaar, S.
出版情報: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.255-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 473