1.

国際会議録
国際会議録
1. Microwave noise in III-V- and SiGe-based HBTs: comparison, trends, and numbers (Invited Paper)
Sakalas, P. ; Schroter, M. ; Racanelli, M.
出版情報: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.151-163,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5470
2.

国際会議録
国際会議録
2. Effects of buried oxide and point defect saturation on redistribution of boron in thin-film silicon-on-insulator (TFSOI)
Park, H. ; Racanelli, M. ; Harris, G. ; Huang, W.L.M.
出版情報: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.63-68,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-23
3.

国際会議録
国際会議録
3. COMPARISON OF MESA-ETCHED AND ION-IMPLANTED GeXSi1-X HETEROJUNCTION BIPOLAR TRANSISTORS
Greve, D. W. ; Racanelli, M.
出版情報: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.785-790,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 262
4.

国際会議録
国際会議録
4. IN SITU TEM STUDIES OF THE GROWTH OF STRAINED Si1-XGeX BY SOLID PHASE EPITAXY
Paine, D.C. ; Howard, D.J. ; Evans, N.D. ; Greve, D.W. ; Racanelli, M. ; Stoffel, N.G.
出版情報: Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A..  pp.561-566,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 202
5.

国際会議録
国際会議録
5. Requirements for TFSOI materials and their effects on devices from a user's perspective
Wilson, S.R. ; Hwang, B.Y. ; Foerstner, J. ; Wetteroth, T. ; Racanelli, M. ; Tsao, J. ; Huang, M.
出版情報: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.413-424,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-11