1.

国際会議録
国際会議録
1. Reliability Evaluation of 4H-SiC JFETs Using I-V Characteristics and Low Frequency Noise
H.K. Chan ; R.C. Stevens ; J.P. Goss ; N.G. Wright ; A.B. Horsfall
出版情報: Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6,2012, St. Petersburg, Russian Federation.  pp.934-937,  2013.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 740-742
2.

国際会議録
国際会議録
2. Electromagnetic Interference in Silicon Carbide DC-DC Converters
O. Mostaghimi ; R.C. Stevens ; N.G. Wright ; A.B. Horsfall
出版情報: Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6,2012, St. Petersburg, Russian Federation.  pp.1044-1047,  2013.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 740-742
3.

国際会議録
国際会議録
3. Low Frequency Noise in 4H-SiC Lateral JFET Structures
H.K. Chan ; R.C. Stevens ; J.P. Goss ; N.G. Wright ; A.B. Horsfall
出版情報: Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA.  pp.473-476,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 717-720
4.

国際会議録
国際会議録
4. Silicon Carbide UV Based Photovoltaic for Hostile Environments
S. Barker ; R.C. Stevens ; K.V. Vassilevski ; I.P. Nikitina ; N.G. Wright
出版情報: Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain.  pp.885-888,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 615-617
5.

国際会議録
国際会議録
5. Effect of Proton Irradiation Induced Defects on 4H-SiC Schottky Diode X-Ray Detectors
R.C. Stevens ; K. Vasilevskiy ; J.E. Lees ; N.G. Wright ; A.B. Horsfall
出版情報: Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd.  pp.547-550,  2011.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 679-680