Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy
- 著者名:
- G. Acosta ( Department of Physics and Astronomy, Brigham Young University, Provo, UT )
- R. Vanfleet ( Department of Physics and Astronomy, Brigham Young University, Provo, UT )
- D. Allred ( Department of Physics and Astronomy, Brigham Young University, Provo, UT )
- R.S. Turley ( Department of Physics and Astronomy, Brigham Young University, Provo, UT )
- 掲載資料名:
- 51st annual technical conference proceedings, April 19-24, 2008, Chicagom, IL
- シリーズ名:
- Annual Technical Conference of Society of Vacuum Coaters
- シリーズ巻号:
- 51
- 発行年:
- 2008
- 開始ページ:
- 443
- 終了ページ:
- 447
- 総ページ数:
- 5
- 出版情報:
- Albuquerque, NM: Society of Vacuum Coaters
- ISSN:
- 07375921
- 言語:
- 英語
- 請求記号:
- A63930/51
- 資料種別:
- 国際会議録
類似資料:
Society of Vacuum Coaters |
SPIE-The International Society for Optical Engineering |
Society of Vacuum Coaters |
MRS - Materials Research Society |
Society of Vacuum Coaters |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |