Sandeep Agnihotri ; Massoud Rostam-Abadi ; Mark J. Rood ; Robert B. Clarkson ; R. Chang
出版情報:
Nanotechnology Topical Conference : 2003 AIChE Annual Meeting, San Francisco, California, November 16-21, 2003. pp.225g-, 2003. New York. American Institute of Chemical Engineers
Sandeep Agnihotri ; Massoud Rostam-Abadi ; Mark J. Rood ; Robert B. Clarkson ; R. Chang
出版情報:
03 AIChE annlual meeting, November 16-21, San Francisco, California, AIChE 2003 annual meeting conference proceedings. pp.225g-, 2003. New York. American Institute of Chemical Engineers
Scanning probe microscopies III : 6-7 February 1995, San Jose, California. pp.110-121, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
High and low concentration for solar electric applications III : 11-12 August 2008, San Diego, California, USA. pp.704308-1-704308-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Defense and security 2008 : special sessions on food safety, visual analytics, resource restricted embedded and sensor networks, and 3D imaging and display : 17-18 March 2008, Orlando, Florida, USA. pp.69830G-1-69830G-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
T. Butkiewicz ; R. Chang ; Z. Wartell ; W. Ribarsky
出版情報:
Defense and security 2008 : special sessions on food safety, visual analytics, resource restricted embedded and sensor networks, and 3D imaging and display : 17-18 March 2008, Orlando, Florida, USA. pp.69830B-1-69830B-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Defense and security 2008 : special sessions on food safety, visual analytics, resource restricted embedded and sensor networks, and 3D imaging and display : 17-18 March 2008, Orlando, Florida, USA. pp.69830E-1-69830E-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering