Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.247-258, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
International Seminar on Novel Trends in Nonlinear Laser Spectroscopy and High-Precision Measurements in Optics. pp.52-62, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
International Seminar on Novel Trends in Nonlinear Laser Spectroscopy and High-Precision Measurements in Optics. pp.8-13, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering