Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California. pp.2-17, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
2000 International Conference on High-Density Interconnect and Systems Packaging, 25-28 April 2000, The Adam's Mark Hotel, Denver, Colorado, USA. pp.232-234, 2000. Reston, VA, Bellingham, Wash.. IMAPS — SPIE-The International Society for Optical
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part2 pp.908-911, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Disordered materials -current developments- : proceedings of the International Seminar on Current Developments in Disordered Materials, held in Kurukshetra, India, January 1996 : CDDM-96. pp.193-198, 1996. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Wireless Technologies and Services for Cellular and Personal Communication Services. pp.127-132, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering