1.

国際会議録
国際会議録
1. Application of Fourier descriptors and neural network to classification of underground images
Tolstoy, L. ; Parsiani, H. ; Ortiz, J.
出版情報: Image and signal processing for remote sensing VIII :24-27 September 2002, Agia Pelagia, Crete, Greece.  pp.268-273,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4885
2.

国際会議録
国際会議録
2. Subsurface material type determination from ground- penetrating radar signatures
Parsiani, H. ; Rodriguez, P. A.
出版情報: Image and signal processing for remote sensing X : 13-15 September 2004, Maspalomas, Gran Canaria, Spain.  pp.301-306,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5573
3.

国際会議録
国際会議録
3. High-resolution vegetation index as measured by radar and its validation with spectrometer
Parsiani, H. ; Torres, M. ; Rodriguez, P. A.
出版情報: Image and signal processing for remote sensing X : 13-15 September 2004, Maspalomas, Gran Canaria, Spain.  pp.284-289,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5573
4.

国際会議録
国際会議録
4. Application of morphological associative memories and Fourier descriptors for classification of noisy subsurface signatures
Ortiz, J.L. ; Parsiani, H. ; Tolstoy, L.
出版情報: Image and signal processing for remote sensing IX : 9-12 September 2003, Barcelona, Spain.  pp.204-212,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5238
5.

国際会議録
国際会議録
5. Application of Fourier descriptors and fuzzy logic to classification of radar subsurface images
Parsiani, H. ; Tolstoy, L.
出版情報: Image and signal processing for remote sensing IX : 9-12 September 2003, Barcelona, Spain.  pp.176-181,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5238