1.

国際会議録
国際会議録
1. Wide-spectral-range, Expanded-beam Spectroscopic Ellipsometer and its Application for Imaging/Mapping of Graded Nanocrystalline Si:H Films
A. Nemeth ; D. Attygalle ; L.R. Dahal ; P. Aryal ; Z. Huang ; C. Salupo ; P. Petrik ; G. Juhasz ; C. Major ; O. Polgar ; M. Fried ; B. Pecz ; R.W. Collins
出版情報: Amorphous and polycrystalline thin-film silicon science and technology--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A..  pp.267-272,  2012.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1321
2.

国際会議録
国際会議録
2. Optical Characterization Using Ellipsometry of Si Nanocrystal Thin Layers Embedded in Silicon Oxide
E. Agocs ; P. Petrik ; M. Fried ; A.G. Nassiopoulou
出版情報: Amorphous and polycrystalline thin-film silicon science and technology--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A..  pp.367-374,  2012.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1321
3.

国際会議録
国際会議録
3. Application of a Dual-spectral-range, Divergent-beam Spectroscopic Ellipsometer for High-speed Mapping of Large-area, Laterally-inhomogeneous, Photovoltaic Multilayers
M. Fried ; G. Juhasz ; C. Major ; A. Nemeth ; P. Petrik ; O. Polgar ; C. Salupo ; Lila R. Dahal ; R.W. Collins
出版情報: Advanced materials processing for scalable solar-cell manufacturing : symposium held April 25-29, 2011, San Francisco, California, U.S.A..  pp.157-162,  2012.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1323
4.

国際会議録
国際会議録
4. Ellipsometric Characterization of Thin Nanocomposite Films with Tunable Refractive Index for Biochemical Sensors
P. Petrik ; H. Egger ; S. Eiden ; E. Agocs ; M. Fried ; B. Pecz ; K. Kolari ; T. Aalto ; R. Horvath ; D. Giannone
出版情報: Titanium dioxide nanomaterials : symposium held April 25-29, 2011, San Francisco, California, U.S.A..  pp.81-88,  2012.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1352
5.

国際会議録
国際会議録
5. Characterization of Thin ZnO Films by Vacuum Ultra-violet Reflectometry
T. Gumprecht ; P. Petrik ; G. Roeder ; M. Schellenberger ; L. Pfitzner
出版情報: Oxide semiconductors and thin films : symposia held November 25-30, 2012, Boston, Massachusetts, U.S.A..  pp.65-70,  2013.  Warrendale, Pa.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1494