1.

国際会議録
国際会議録
1. Enhanced hydrogenation in polycrystalline Si thin films using ultrasound treatment
Ostapenko,S. ; Koshka,Y. ; Jastrzebski,L. ; Smeltzer,R.K.
出版情報: Active matrix liquid crystal displays technology and applications : 10-11 February, 1997, San Jose, California.  pp.176-183,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3014
2.

国際会議録
国際会議録
2. Spatially Resolved Diagnostic in Multicrystalline Silicon for Solar Cells Using Room Temperature Photoluminescence Spectroscopy
Tarasov,I. ; Ostapenko,S. ; Haessler,C. ; Raisner,E.-U.
出版情報: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.433-440,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3895
3.

国際会議録
国際会議録
3. Resonance Ultrasonic Diagnostics of As-Grown and Process-Induced Defects in Cz Silicon
Belyaev,A. ; Tarasov,I. ; Ostapenko,S. ; Koveshnikov,S. ; Kochelap,V.A. ; Beyaev,A.E.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.660-669,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218
4.

国際会議録
国際会議録
4. Mechanism of ultrasonic enhanced hydrogenation in poly-Si thin films using ultrasound treatment
Ostapenko,S.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.197-202,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
5.

国際会議録
国際会議録
5. Room-temperature luminescence diagnostics in polycrystalline silicon
Koshka,Y. ; Ostapenko,S. ; jastrzebski,L. ; Cao,J. ; Kaleis,J.P.
出版情報: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing.  pp.41-48,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3215