1.

国際会議録
国際会議録
1. Study of Point Defects in Impurity-Doped ZnSe by a Monoenergetic Positron Beam
Miyajima,T. ; Wei,L. ; Tanigawa,S. ; Okuyama,H. ; Akimoto,K. ; Mori,Y.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.3  pp.1423-1426,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
2.

国際会議録
国際会議録
2. Structural Study of Degraded II-VI Blue-Light Emitters
Tomiya,S. ; Ukita,M. ; Okuyama,H. ; Nakano,K. ; Itoh,S. ; Ishibashi,A. ; Morita,E. ; Ikeda,M.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1109-1116,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
3.

国際会議録
国際会議録
3. Origin of the Carrier Reduction by Annealing in n-Type ZnSe
Miyajima,T. ; Okuyama,H. ; Akimoto,K. ; Wei,L. ; Tanigawa,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.483-487,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118