Point Defects in SiC

Point Defects in SiC

著者名:

掲載資料名:

Silicon Carbide 2008--materials, processing and devices : symposium held March 25-27, 2008, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1069

発行年:

2008

開始ページ:

65

終了ページ:

76

総ページ数:

12

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781605110394 [1605110396]

言語:

英語

請求記号:

M23500/1069

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00049372
シリーズID:	PA00000011
会議名:	MRS Spring Meeting
回次:	2008
会議開催地:	San Francisco, California, U.S.A.
会議開催年:	2008.05.25-2008.05.27

類似資料:

1 国際会議録 Theory of Neutral Divacancy in SiC: A Defect for Spintronics A. Gali, A. Gällström, N.T. Son, E. Janzén Trans Tech Publications	7 国際会議録 Defects Identified in SiC and Their Implications M. Bockstedte, A. Marini, A. Gali, O. Pankratov, A. Rubio Trans Tech Publications
2 国際会議録 Theoretical Investigation of an Intrinsic Defect in SiC Gali, A., Deak, P., Son, N.T., Janzen, E. Trans Tech Publications	8 国際会議録 Point Defects and their Aggregation in Silicon Carbide A. Gali, T. Hornos, M. Bockstedte, T. Frauenheim Trans Tech Publications
3 国際会議録 Theoretical Investigation of an Intrinsic Defect in SiC Gali, A., Deak, P., Son, N.T., Janzen, E. Trans Tech Publications	9 国際会議録 Investigation of Mo Defects in 4H-SiC by Means of Density Functional Theory A. Csóré, A. Gällström, E. Janzén, A. Gali Trans Tech Publications
4 国際会議録 Characterization of Semi-Insulating SiC Nguyen Tien Son, Patrick Carlsson, Bjoem Magnusson, Erik Janzen Materials Research Society	10 国際会議録 Calculation of Hyperfine Constants of Defects in 4H-SiC Gali, A., Deak, P., Son, N.T., Janzen, E., von Bardeleben, H.J., Monge, J.-L. Trans Tech Publications
5 国際会議録 A Theoretical Study on Aluminium-Related Defects in SiC T. Hornos, A. Gali, N.T. Son, E. Janzen Trans Tech Publications	11 国際会議録 Defects in SiC: Theory A. Gali Trans Tech Publications
6 国際会議録 New Type of Defects Explored by Theory: Silicon Interstitial Clusters in SiC A. Gali, T. Hornos, N.T. Son, E. Janzén Trans Tech Publications	12 国際会議録 Self Diffusion in SiC: the Role of Intrinsic Point Defects Mattausch, A., Bockstedte, M., Pankratov, O. Trans Tech Publications

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