1.

国際会議録
国際会議録
1. Characterization of Structural Quality of Bonded Silicon-on-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy
Nguyen, N.V. ; Maslar, J.E. ; Kim, Jin-Yong ; Han, Jin-Ping ; Park, Jin-Won ; Chandler-Horowitz, D. ; Vogel, E.M.
出版情報: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.127-132,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 809
2.

国際会議録
国際会議録
2. Thickness Determination of Ultra-Thin SiO2 Films on Si by Spectroscopic Ellipsometry
Nguyen, N.V. ; Richter, C.A.
出版情報: Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.183-193,  1997.  Pennington, New Jersey.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-10
3.

国際会議録
国際会議録
3. CHARACTERIZATION OF THE ZnSe/GaAs INTERFACE LAYER BY TEM AND SPECTROSCOPIC ELLIPSOMETRY
Dahmani, R. ; Salamanca-Riba, L. ; Beesabathina, D.P. ; Nguyen, N.V. ; Chandler-Horowitz, D. ; Jonker, B.T.
出版情報: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.271-274,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 280
4.

国際会議録
国際会議録
4. Band Alignment Issues in Metal/Dielectric Stacks: A Combined Photoemission and Inverse Photoemission Study of the HfO2/Pt and HfO2/Hf Systems
Sayan, S. ; Bartynski, R.A. ; Robertson, J. ; Suehle, J.S. ; Vogel, E. ; Nguyen, N.V. ; Ehrstein, J. ; Kopanski, J.J. ; Suzer, S. ; Holl, M.B. ; Garfunkel, E.
出版情報: Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium.  pp.255-263,  2004.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2004-01