1.

国際会議録
国際会議録
1. Shack-Hartmann wavefront sensor precision and accuracy
Neal, D.R. ; Copland, J. ; Neal, D.A.
出版情報: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.148-160,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4779
2.

国際会議録
国際会議録
2. Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor
Neal, D.R. ; Pulaski, P. ; Raymond, T.D. ; Neal, D.A. ; Wang, Q. ; Griesmann, U.
出版情報: Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA.  pp.129-138,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5162
3.

国際会議録
国際会議録
3. Measurement of aberrations in microlenses using a Shack-Hartmann wavefront sensor
Pulaski, P.D. ; Roller, J.P. ; Neal, D.R. ; Ratte, K.
出版情報: Current developments in lens design and optical engineering III : 8-9 July 2002, Seattle, USA.  pp.44-52,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4767
4.

国際会議録
国際会議録
4. Application of Shack-Hartmann wavefront sensing technology to transmissive optic metrology
Rammage, R.R. ; Neal, D.R. ; Copland, R.J.
出版情報: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.161-172,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4779
5.

テクニカルペーパー
テクニカルペーパー
5. Shack-Hartmann wavefront sensor testing of aero-optic phenomena
Neal, D.R. ; Hedlund, E. ; Lederer, M. ; Collier, A. ; Spring, C. ; Yanta, W.
出版情報: AIAA paper.  pp.1-13,  1998.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : AIAA Advanced Measurement and Ground Testing Technology Conference
シリーズ巻号: 1998
6.

国際会議録
国際会議録
6. High-speed noninterferometric nanotopographic characterization of Si wafer surfaces
Raymond, T.D. ; Neal, D.R. ; Topa, D.M. ; Schmitz, T.L.
出版情報: Nanoscale Optics and Applications.  pp.208-216,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4809