1.

国際会議録
国際会議録
1. Average atmosphere temperature measurement by a frequency-shifted feedback laser
Kibayashi,N. ; Hara,T. ; Yoshida,M. ; Nakamura,K. ; Ito,H.
出版情報: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.322-329,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4150
2.

国際会議録
国際会議録
2. Performance of the future spaceborne dual-wavelength radar for rain and snow observation
Adhikari,N.B. ; Nakamura,K.
出版情報: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  pp.1-12,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4152
3.

国際会議録
国際会議録
3. Polarimetric SAR observation of sea ice in the Sea of Okhotsk
Wakabayashi,H. ; Shimada,M. ; Matsuoka,T. ; Nakamura,K. ; Nishio,F.
出版情報: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  pp.339-346,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4152
4.

国際会議録
国際会議録
4. "Tropical precipitation studies using VHF/L-band wind profilers and disdrometer over Gadanki, India"
Reddy,K.K. ; Nakamura,K. ; Kozu,T. ; Jain,A.R. ; Rao,D.N.
出版情報: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  pp.62-72,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4152
5.

国際会議録
国際会議録
5. Characteristics of the mirror image of precipitation observed by TRMM precipitation radar
Li,J. ; Nakamura,K.
出版情報: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  pp.141-151,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4152
6.

国際会議録
国際会議録
6. Coaxially excited gas lasers:toward the vacuum ultraviolet region
El-Oseary,M.A. ; Jitsuno,T. ; Nakatsuka,M. ; Ohoguchi,Y. ; Ido,T. ; Nakamura,K. ; Horiguchi,S.
出版情報: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.774-779,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3889
7.

国際会議録
国際会議録
7. Mid-infrared camera and spectrometer(MICS)and sky noise measurement in the N-band
Miyata,T. ; Kataza,H. ; Okamoto,Y. ; Onaka,T. ; Yamashita,T. ; Nakamura,K.
出版情報: Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany.  Part2  pp.842-852,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4008
8.

国際会議録
国際会議録
8. Control system for the Subaru Telescope
Tanaka,W. ; Sasaki,T. ; Noguchi,T. ; Okita,K. ; Nakamura,K. ; Ito,F. ; Katsuki,Y. ; Ishihara,S.
出版情報: Telescope control systems III : 20-21 March 1998, Kona, Hawaii.  pp.478-482,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3351
9.

国際会議録
国際会議録
9. Effects of metal impuritites on the etch rate selectivity of(110)/(111)in(11O)Si anisotropic etching
Hirata,Y. ; Tsugai,M. ; Tanimoto,K. ; Usami,T. ; Yamaguchi,Y. ; Otani,H. ; Nakamura,K.
出版情報: Micromachining and microfabrication process technology V : 20-22 September, 1999, Santa Clara, California.  pp.276-283,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3874
10.

国際会議録
国際会議録
10. Effect of Shape of Crystal-Melt Interface on Point Defect Reaction in Silicon Crystals
Nakamura,K. ; Maeda,S. ; Togawa,S. ; Saishoji,T. ; Tomioka,J.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.31-43,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218