1.

国際会議録
国際会議録
1. Optical Methods For Defect Characterization In Light-Ion Implanted Silicon Carbide
Muntele, Claudiu I. ; Muntele, Iulia C. ; Ila, Daryush ; Poker, David B. ; Hensley, Dale K.
出版情報: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.197-204,  2002.  Warrendale, Pa.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 719
2.

国際会議録
国際会議録
2. Raman And Optical Absorption Studies Of Silicon Carbide Structure Damage By Ion Implantation
Muntele, Claudiu I. ; Muntele, Iulia C. ; Ila, D. ; Poker, David B. ; Hensley, Dale K.
出版情報: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.191-196,  2002.  Warrendale, Pa.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 719
3.

国際会議録
国際会議録
3. Depth Profiling of SiC Lattice Damage Using Micro-Raman Spectroscopy
Muntele, Iulia C. ; Ila, Daryush ; Muntele, Claudiu I. ; Poker, David B. ; Hensley, Dale K.
出版情報: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.209-214,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 692