1.

国際会議録
国際会議録
1. Practical differences among probabilities, possibilities, and credibilities
Grandin, J.-F. ; Moulin, C.
出版情報: Sensor fusion : architectures, algorithms, and applications VI : 3-5 April 2002, Orlando, USA.  pp.86-97,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4731
2.

国際会議録
国際会議録
2. Behavior of Calix[4]arene-bis-crown-6 under Irradiation: Electrospray-Mass Spectrometry Investigation and Molecular Dynamics Simulations on Cs+ and Na+ Complexes of a Degradation Compound
Lamare, V. ; Dozol, J.-F. ; Allain, F. ; Virelizier, H. ; Moulin, C. ; Jankowski, C. ; Tabet, J.-C.
出版情報: Calixarenes for separations.  pp.56-,  2000.  Washington, DC.  American Chemical Society
シリーズ名: ACS symposium series
シリーズ巻号: 757
3.

国際会議録
国際会議録
3. Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography
Pernot, E. ; Neyret, E. ; Moulin, C. ; Pernot-Rejmankova, P. ; Templier, F. ; Cioccio, L.Di. ; Billon, T. ; Madar, R.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.419-422,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
4.

国際会議録
国際会議録
4. UV scanning enabling advanced SOI defectivity monitoring
Maleville, C. ; Moulin, C. ; Delprat, D. ; McMillan, W. ; Payne, J. ; Birdwell K. ; Moirin R.
出版情報: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.357-362,  2005.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2005-03
5.

国際会議録
国際会議録
5. Seed Surface Preparation for SiC Sublimation Growth
Pelissier, B. ; Moulin, C. ; Pernot, E. ; Anikin, M. ; Grosse, P. ; Faure, C. ; Ferrand, B. ; Couchaud, M. ; Basset, G. ; Madar, R.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.47-50,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
6.

国際会議録
国際会議録
6. Progress in SiC Bulk Growth
Anikin, M. ; Chaix, O. ; Pernot, E. ; Pelissier, B. ; Pons, M. ; Pisch, A. ; Bernard, C. ; Grosse, P. ; Faure, C. ; Grange, Y. ; Basset, G. ; Moulin, C. ; Madar, R.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.13-16,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
7.

国際会議録
国際会議録
7. SiC Single Crystal Growth by Sublimation: Experimental and Numerical Results
Moulin, C. ; Pons, M. ; Pisch, A. ; Grosse, P. ; Faure, C. ; Basset, A. ; Basset, G. ; Passero, A. ; Billon, T. ; Pelissier, B. ; Anikin, M. ; Pernot, E. ; Pernot-Rejmankova, P. ; Madar, R.
出版情報: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.7-10,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 353-356
8.

国際会議録
国際会議録
8. Progress in 4H-SiC Bulk Growth
Anikin, M. ; Pernot, E. ; Pelissier, B. ; Pons, M. ; Pisch, A. ; Bernard, C. ; Billon, T. ; Faure, C. ; Moulin, C. ; Madar, R.
出版情報: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.21-24,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 353-356
9.

国際会議録
国際会議録
9. MSG improved capabilities for marine aerosol characterization
Moulin, C.
出版情報: First MSG RAO Workshop, 17-19 May 2000, CNR, Bologna, Italy.  pp.119-122,  2000.  Noordwijk, The Netherlands.  ESA Publications Division
シリーズ名: ESA SP
シリーズ巻号: 452
10.

国際会議録
国際会議録
10. Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography
Pernot, E. ; Neyret, E. ; Moulin, C. ; Pernot-Rejmankova, P. ; Templier, F. ; Di Cioccio, L. ; Billon, T. ; Madar, R.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.419-422,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393