1.

テクニカルペーパー
テクニカルペーパー
1. Analysis of In-Space Assembly of Modular Systems
Moses,R. ; Van Laak,J. ; Chytka,T. ; Amundsen,R. ; Todd,K. ; Stambolian,D. ; Johnson,S. ; Dorsey,J. ; Doggett,W. ; Reeves,J. ; Moe,R.
出版情報: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : Space Exploration Conference
シリーズ巻号: 1st
2.

テクニカルペーパー
テクニカルペーパー
2. An Advanced Buffet Load Alleviation System
Burnham,J. ; Pitt,D. ; White,E. ; Henderson,D. ; Moses,R.
出版情報: A collection of technical papers : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference and Exhibit : AIAA/ASME/ASCE/AHS Adaptive Structures Forum : AIAA Non-Deterministic Approaches Forum : AIAA Gossamer Spacecraft Forum, Seattle, Washington, 16-19 April 2001.  v. 5  pp.3579-3588,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
シリーズ巻号: 2001
3.

テクニカルペーパー
テクニカルペーパー
3. MAVRIC Flutter Model Transonic Limit Cycle Oscillation Test
Edwards,J. ; Schuster,D. ; Spain,C. ; Keller,D. ; Moses,R.
出版情報: A collection of technical papers : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference and Exhibit : AIAA/ASME/ASCE/AHS Adaptive Structures Forum : AIAA Non-Deterministic Approaches Forum : AIAA Gossamer Spacecraft Forum, Seattle, Washington, 16-19 April 2001.  v. 2  pp.810-824,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
シリーズ巻号: 2001
4.

国際会議録
国際会議録
4. Defect printability study with programmed defects on halftone reticles
Dettmann,W. ; Haffner,H. ; Heumann,J.P. ; Liebe,R. ; Ludwig,R. ; Moses,R.
出版情報: Photomask and Next-Generation Lithography Mask Technology VIII.  pp.479-487,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4409