1.

国際会議録
国際会議録
1. Prevention of Seizure in Deep Drawing Using Plastic Die
Harada, Y. ; Murao, T. ; Mori, K. ; Tsuchida, N. ; Fukaura, K.
出版情報: Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005.  pp.763-768,  2006.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 505-507
2.

国際会議録
国際会議録
2. Crab: the standard x-ray candle with all (modern) x-ray satellites [5898-03]
Kirsch, M. G. F. ; Briel, U. G. ; Burrows, D. ; Campana, S. ; Cusumano, G. ; Ebisawa, K. ; Freyberg, M. J. ; Gualnazzi, M. ; Haberl, F. ; Jahoda, K. ; Kaastra, J. ; Kretschmar, P. ; Larsson, S. ; Lubinski, P. ; Mori, K.
出版情報: UV, X-ray, and gamma-ray space instrumentation for astronomy XIV : 1-3 August 2005, San Diego, California, USA.  pp.589803-589803,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5898
3.

国際会議録
国際会議録
3. Fe-Sb-O based fluid-bed catalysts applied to various types of ammoxidation reactions
Sasaki, Y. ; Yamamoto, H. ; Mori, K. ; Miyaki, K.
出版情報: Science and technology in catalysis 1998 : proceedings of the Third Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 19-24, 1998.  pp.335-,  1999.  Tokyo.  Elsevier
シリーズ名: Studies in surface science and catalysis
シリーズ巻号: 121
4.

国際会議録
国際会議録
4. Readout modes and automated operation of the Swift X-ray Telescope
Hill, J.E. ; Burrows, D.N. ; Nousek, J.A. ; Abbey, A.F. ; Ambrosi, R.M. ; Brauninger, H.W. ; Burkert, W. ; Campana, S. ; Cheruvu, C. ; Cusumano, G. ; Freyberg, M.J. ; Hartner, G.D. ; Klar, R. ; Mangels, C. ; Moretti, A. ; Mori, K. ; Morris, D.C. ; Short, A.D.T. ; Tagliaferri, G. ; Watson, D.J. ; Wood, P. ; Wells, A.A.
出版情報: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.217-231,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5165
5.

国際会議録
国際会議録
5. The Swift X-Ray Telescope
Burrows, D.N. ; Hill, J.E. ; Nousek, J.A. ; Wells, A.A. ; Chincarini, G. ; Abbey, A.F. ; Beardmore, A.P. ; Bosworth, J. ; Brauninger, H.W. ; Burkert, W. ; Campana, S. ; Capalbi, M. ; Chang, W. ; Citterio, O. ; Freyberg, M.J. ; Giommi, P. ; Hartner, G.D. ; Killough, R. ; Kittle, B. ; Klar, R. ; Mangels, C. ; McMeekin, M. ; Miles, B.J. ; Moretti, A. ; Mori, K. ; Morris, D.C. ; Mukerjee, K. ; Osborne, J.P. ; Short, A.D.T. ; Tagliaferri, G. ; Tamburelli, F. ; Watson, D.J. ; Willingale, R. ; Zugger, M.E.
出版情報: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.201-216,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5165
6.

国際会議録
国際会議録
6. Swift XRT effective area measured at the Panter end-to-end tests
Tagliaferri, G. ; Moretti, A. ; Campana, S. ; Abbey, A.F. ; Ambrosi, R.M. ; Angelini, L. ; Beardmore, A.P. ; Brauninger, H.W. ; Burkert, W. ; Burrows, D.N. ; Capalbi, M. ; Chincarini, G. ; Citterio, O. ; Cusumano, G. ; Freyberg, M.J. ; Giommi, P. ; Hartner, G.D. ; Hill, J.E. ; Mori, K. ; Morris, D.C. ; Mukerjee, K. ; Nousek, J.A. ; Osborne, J.P. ; Short, A.D.T. ; Tamburelli, F. ; Watson, D.J. ; Wells, A.A.
出版情報: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.241-250,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5165
7.

国際会議録
国際会議録
7. SWIFT XRT point spread function measured at the Panter end-to-end tests
Moretti, A. ; Campana, S. ; Tagliaferri, G. ; Abbey, A.F. ; Ambrosi, R.M. ; Angelini, L. ; Beardmore, A.P. ; Brauninger, H.W. ; Burkert, W. ; Burrows, D.N. ; Capalbi, M. ; Chincarini, G. ; Citterio, O. ; Cusumano, G. ; Freyberg, M.J. ; Giommi, P. ; Hartner, G.D. ; Hill, J.E. ; Mori, K. ; Morris, D.C. ; Mukerjee, K. ; Nousek, J.A. ; Osborne, J.P. ; Short, A.D.T. ; Tamburelli, F. ; Watson, D.J. ; Wells, A.A.
出版情報: X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California.  pp.232-240,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5165
8.

国際会議録
国際会議録
8. Detection algorithm of lung cancer candidate nodules on multislice CT images
Oda, T. ; Kubo, M. ; Kawata, Y. ; Niki, N. ; Eguchi, K. ; Ohmatsu, H. ; Kakinuma, R. ; Kaneko, M. ; Kusumoto, M. ; Moriyama, N. ; Mori, K. ; Nishiyama, H.
出版情報: Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA.  Part Three  pp.1354-1361,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4684
9.

国際会議録
国際会議録
9. Classification experiments of pulmonary nodules using high-resolution CT images
Ichikawa, W. ; Kawata, Y. ; Niki, N. ; Ohmatsu, H. ; Kusumoto, M. ; Kakinuma, R. ; Mori, K. ; Nishiyama, H. ; Eguchi, K. ; Kaneko, M. ; Moriyama, N.
出版情報: Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA.  Part Three  pp.1280-1291,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4684
10.

国際会議録
国際会議録
10. CAD system for lung cancer based on low-dose single-slice CT image
Kubo, M. ; Kubota, K. ; Yamada, N. ; Kawata, Y. ; Niki, N. ; Eguchi, K. ; Ohmatsu, H. ; Kakinuma, R. ; Kaneko, M. ; Kusumoto, M. ; Mori, K. ; Nishiyama, H. ; Moriyama, N.
出版情報: Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA.  Part Three  pp.1262-1269,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4684