Marker, D. K. ; Holt, E. ; Patrick, B. G. ; Sheikh, D. A. ; Moore, J. D. ; Rotge, J. R. ; Wilkes, J. M.
出版情報:
Advanced wavefront control : methods, devices, and applications II : 2-3 August 2004, Denver, Colorado, USA. pp.213-220, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Smythe, R. F. ; Swain, M. R. ; Alvarez-Salazar, O. S. ; Moore, J. D.
出版情報:
New frontiers in stellar interferometry : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.1802-1812, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Moore, J. D. ; Patrick, B. G. ; Chodimella, S. ; Marker, D. ; deBlonk, B.
出版情報:
UV/optical/IR space telescopes : innovative technologies and concepts II : 31 July-1 August, 2005, San Diego, California, USA. pp.58990Z-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Chodimella, S. ; Moore, J. D. ; Patrick, B. G. ; deBlpnk, B. ; deBlonk, B. ; Marker, D. K.
出版情報:
Advanced wavefront control : methods, devices, and applications III : 31 July-2 August 2005, San Diego, California, USA. pp.589416-589416, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Haguenauer, P. ; Serabyn, E. ; Bloemhof, E. E. ; Wallace, J. K. ; Gappinger, R. O. ; Mennesson, B. P. ; Troy, M. ; Koresko, C. D. ; Moore, J. D.
出版情報:
Techniques and instrumentation for detection of exoplanets II : 2-4 August 2005, San Diego, California, USA. pp.59050S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Moore, J. D. ; Patrick, B. G. ; Chodimella, S. ; Marker, D. K. ; Maji, A.
出版情報:
Advanced wavefront control : methods, devices, and applications II : 2-3 August 2004, Denver, Colorado, USA. pp.221-229, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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