1.

国際会議録
国際会議録
1. Method of HWIL simulation for the dual-mode optical sensor
Yonezawa,T. ; Kinoshita,T. ; Ohtake,R. ; Nakajima,H. ; Miyauchi,H.
出版情報: Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida.  pp.120-127,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3697
2.

国際会議録
国際会議録
2. Infrared image target detection process using continuous features
Kikuchi,M. ; Tamura,H. ; Ono,M. ; Miyauchi,H. ; Kobayashi,S.
出版情報: Automatic target recognition X : 26-28 April 2000, Orlando, USA.  pp.465-475,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4050
3.

国際会議録
国際会議録
3. Noncontact 3D shape inspection based on optical ring imaging system
Okada,S. ; Imade,M. ; Miyauchi,H. ; Miyoshi,T. ; Sumimoto,T. ; Yamamoto,H.
出版情報: Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II.  pp.58-65,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2909
4.

国際会議録
国際会議録
4. Diagnosing abnormal operating conditions of rotational machineries and machine tools with physical wavelets
Takeda,F. ; Okada,S. ; Imade,M. ; Miyauchi,H.
出版情報: Process Control and Inspection for Industry.  pp.417-426,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4222