Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.75-81, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Mikulla, M. ; Kelemen, M.T. ; Walther, M. ; Kiefer, R. ; Moritz, R. ; Weimann, G.
出版情報:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.11-18, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Konstanzer, H. ; Damman, M. ; Mikulla, M. ; Poprawe, R. ; Weimann, G.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.1-8, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Shah, R.E. ; Baumann, H. ; Serries, D. ; Mikulla, M. ; Keiffer, R.
出版情報:
Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium. pp.253-263, 2001. Pennington, N.J.. Electrochemical Society
Sah, R.E. ; Mikulla, M. ; Schneider, H. ; Benkhelifa, F. ; Dammann, M. ; Quay, R. ; Fleisner, J. ; Walther, M. ; Weimann, G.
出版情報:
State-of-the-art program on compound semiconductors (SOTAPOCS XLII) and processes at the compound-semiconductor/solution interface : proceedings of the international symposia. pp.338-349, 2005. Pennington, N.J.. Electrochemical Society
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