Effect of Charge Distribution on Burnout Threshold of Hardened Power MOSFET
- 著者名:
Salame, C. ( Universifte de Perpignan, France ) Pelanchon, F. ( Universifte de Perpignan, France ) Mialhe, P. ( Universifte de Perpignan, France ) Hoffmann, A. ( Supelec France ) Charles, J.-P. ( Supelec France ) Kerns, S. ( Franklin W. Olin College of Engineering, USA ) Kerns, D.V. ( Franklin W. Olin College of Engineering, USA ) Adams, L. ( Brunel University, United Kingdom ) - 掲載資料名:
- Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 439
- 発行年:
- 2000
- 開始ページ:
- 25
- 終了ページ:
- 30
- 総ページ数:
- 6
- 出版情報:
- Noordwijk, The Netherlands: ESA Publications Division
- ISSN:
- 03796566
- ISBN:
- 9789290927563 [9290927569]
- 言語:
- 英語
- 請求記号:
- E11690/439
- 資料種別:
- 国際会議録
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