Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA. pp.617901-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.149-151, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Meyendorf, N. ; Altpeter, I. ; Netzelmann, U. ; Hoffmann, J. ; Nichtl-Pecher, W. ; Grimm, H.
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Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.145-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Rosner, H. ; Meyendorf, N. ; Sathish, S. ; Matikas, T. E.
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Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.73-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Hoffmann, J. ; Sathish, S. ; Khobaib, M. ; Meyendorf, N. ; Netzelmann, U. ; Matikas, T. E.
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Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.67-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.247-253, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.47-53, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Siddoju, A. ; Meyendorf, N. ; Haupert, M. ; David, P.
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Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.241-246, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hoffmann, J. ; Kramb, V. ; Johnson, J. ; Meyendorf, N.
出版情報:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.129-136, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.146-153, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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