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Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.235-240, 1988. Pittsburgh, Pa.. Materials Research Society
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Ultrasensitive and single-molecule detection technologies : 21-22 and 24 January 2006, San Jose, California, USA. pp.60920R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA. pp.55-66, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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出版情報:
Ultrasensitive and single-molecule detection technologies : 21-22 and 24 January 2006, San Jose, California, USA. pp.60920L-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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出版情報:
Semiconductor photodetectors III : 25 January 2006, San Jose California, USA. pp.61190B-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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出版情報:
Semiconductor photodetectors III : 25 January 2006, San Jose California, USA. pp.61190A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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出版情報:
Semiconductor photodetectors III : 25 January 2006, San Jose California, USA. pp.611909-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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Silicon-on-insulator technology and devices XII : proceedings of the international symposium. pp.27-32, 2005. Pennington, N.J.. Electrochemical Society
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出版情報:
Biomedical nanotechnology architectures and applications : 20-24 January 2002, San Jose, USA. pp.89-97, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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出版情報:
Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.305-, 1998. Pittsburgh, Pa.. MRS - Materials Research Society
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