1.

国際会議録
国際会議録
1. Orthoscopic long-focal-depth 3D integral imaging (Invited Paper) [6394-15]
Martinez-Corral, M. ; Martinez-Cuenca, R. ; Saavedra, G. ; Javidi, B.
出版情報: Unmanned/unattended sensors and sensor networks III : 11-12 September 2006, Stockholm, Sweden.  pp.63940H-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6394
2.

国際会議録
国際会議録
2. Overcoming sensor constraints in 3D integral imaging (Invited Paper) [5986-04]
Martinez-Corral, M. ; Martinez-Cuenca, R. ; Saavedra, G. ; Javidi, B.
出版情報: Unmanned/unattended sensors and sensor networks II : 26-28 September 2005, Bruges, Belgium.  pp.598604-598604,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5986
3.

国際会議録
国際会議録
3. New developments in active and passive 3D image sensing, visualization, and processing (Keynote Paper) [5986-01]
Javidi, B. ; Tajahuerce, E. ; Martinez-Corral, M. ; Naughton, T. J. ; Frauel, Y.
出版情報: Unmanned/unattended sensors and sensor networks II : 26-28 September 2005, Bruges, Belgium.  pp.598601-598601,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5986
4.

国際会議録
国際会議録
4. Point spread function engineering in confocal scanning microscopy
Martinez-Corral, M.
出版情報: Wave-optical wywtems engineering II : 3-4 August 2003, San Diego, California, USA.  pp.112-122,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5182
5.

国際会議録
国際会議録
5. Analysis of lens aberrations using a retinoscope as a Foucault test
Furlan, W. D. ; Munoz-Escriva, L. ; Pons, A. ; Martinez-Corral, M.
出版情報: Sixth International Conference on Education and Training in Optics and Photonics.  pp.408-411,  2000.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3831
6.

国際会議録
国際会議録
6. Three-dimensional imaging with high spatial resolution: scanning microscopy (Invited Paper)
Martinez-Corral, M. ; Saavedra, G.
出版情報: Photonic Devices and Algorithms for Computing VI.  pp.158-169,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5556
7.

国際会議録
国際会議録
7. Apodization in confocal scanning microscopy
Andres, P. ; Martinez-Corral, M.
出版情報: 19th Congress of the International Commission for Optics: Optics for the Quality of Life.  pp.644-645,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4829
8.

国際会議録
国際会議録
8. Enhancement of optical sectioning in reflection confocal microscopy by phase-shifting apodizers
Martinez-Corral, M. ; Caballero, M.T. ; Ibanez-Lopez, C.
出版情報: 19th Congress of the International Commission for Optics: Optics for the Quality of Life.  pp.656-657,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4829
9.

国際会議録
国際会議録
9. Effective axial superresolution in single-photon 4Pi microscopy by Toraldo rings
Martinez-Corral, M. ; Caballero, M.T. ; Pons, A.
出版情報: 19th Congress of the International Commission for Optics: Optics for the Quality of Life.  pp.654-655,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4829
10.

国際会議録
国際会議録
10. Optimized integral imaging display by global pixel mapping (Invited Paper) [6311-01]
Martinez-Corral, M. ; Martinez-Cuenca, R. ; Saavedra, G. ; Javidi, B.
出版情報: Optical Information Systems IV.  pp.631101-631101,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6311