Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA. pp.85-93, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.533-538, 1992. Zurich, Switzerland. Trans Tech Publications
Ultraviolet atmospheric and space remote sensing : methods and instrumentation : 7-8 August 1996. pp.252-258, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.611-616, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.2 pp.1051-1056, 1992. Zurich, Switzerland. Trans Tech Publications