1.

国際会議録
国際会議録
1. NON-DESTRUCTIVE ASSESSMENT OF THIN FILM STRESSES AND CRYSTAL QUALITY OF SILICON ON INSULATOR MATERIALS WITH RAMAN SPECTROSCOPY
De Wolf, Ingrid ; Vanhellemont, Jan ; Maes, Herman E.
出版情報: Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A..  pp.53-60,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 188
2.

国際会議録
国際会議録
2. THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S
Wolf, Ingrid De ; Bellens, Rudi ; Groeseneken, Guido ; Maes, Herman E.
出版情報: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.281-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 309
3.

国際会議録
国際会議録
3. VARIATION OF LOCAL MECHANICAL STRESS DURING THE DIFFERENT PROCESSING STEPS OF IC-ISOLATION: A MICRO-RAMAN SPECTROSCOPY STUDY
Wolf, Ingrid De ; Maes, Herman E. ; Norstrom, Hans
出版情報: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.355-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 308
4.

国際会議録
国際会議録
4. THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S
Wolf, Ingrid De ; Bellens, Rudi ; Groeseneken, Guido ; Maes, Herman E.
出版情報: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.349-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 308