1.

国際会議録
国際会議録
1. Non-Contact Characterization of Ultrathin Dielectrics for the Gigabit Era*
Roy,P.K. ; Chacon,C. ; Ma,Y. ; Kizilyalli,I.C. ; Horner,G.S. ; Verkuil,R.L. ; Miller,T.G.
出版情報: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.280-294,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3322
2.

国際会議録
国際会議録
2. Multisensor distributed extended Kalman filtering algorithm and its application to radar/IR target tracking
Cui,N. ; Xie,W. ; Yu,X. ; Ma,Y.
出版情報: Acquisition, tracking, and pointing XI : 23-24 April 1997, Orlando, Florida.  pp.323-330,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3086
3.

国際会議録
国際会議録
3. Four-unit composite thin film IR detector
Pang,Z. ; Jiang,B. ; Qi,H. ; Ma,Y.
出版情報: Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China.  pp.230-235,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2894
4.

国際会議録
国際会議録
4. Analysis of errors and calibration method for manufacturing multilevel diffractive optical element by ion etching
Fu,Y. ; Lu,Z. ; Ma,Y. ; Weng,Z.
出版情報: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.181-184,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3557
5.

国際会議録
国際会議録
5. "Design, fabrication, and characterization of broadhand multilayer mirrors for EUV optics at normal incidence"
Wang,Z. ; Kun,C. ; Ma,Y. ; Chen,B. ; Cao,J. ; Zhou,Z. ; Chen,X. ; Michette,A.G.
出版情報: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.83-90,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4146
6.

国際会議録
国際会議録
6. 18- to 20-nm broadband multilayer at normal incidence
Ke,C. ; Wang,Z. ; Ma,Y. ; Cao,J. ; Chen,X.
出版情報: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.354-358,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4012
7.

国際会議録
国際会議録
7. The Mechanical Characteristics of a Ductile Zirconia Containing 2.5% Yttria
Ma,Y. ; Sorensen,O.T. ; Langdon,T.G.
出版情報: Superplasticity in advanced materials : ICSAM-94 : proceedings of the 1994 International Conference on Superplasticity in Advanced Materials (ICSAM-94), held at the Russian Academy of Administration in Moscow on May 24-26, 1994.  pp.439-444,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 170-172
8.

国際会議録
国際会議録
8. Cavity Growth in Superplastic Materials:The Significance of Fine Grain and Nanocrystalline Structure
Ma,Y. ; Langdon,T.G.
出版情報: Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992.  pp.539-542,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 126-128
9.

国際会議録
国際会議録
9. Ultrathin oxide for sub-O.25-ｦﾌm technology in silicon ICs: impact of stacking and nitridation
Roy,P.K. ; Ma,Y.
出版情報: Microelectronic Device Technology : 1-2 October 1997, Austin, Texas.  pp.61-71,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3212
10.

国際会議録
国際会議録
10. Failure of polymer-metal interfaces under hygrothermal loading
Tay,A.A.O. ; Ma,Y. ; Ong,S.H.
出版情報: Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France.  pp.471-481,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4019