Blank Cover Image

In-Situ Probing of Atomic Layer Deposition Processes using Infrared and Near Infrared Spectroscopy

著者名:
掲載資料名:
Atomic layer deposition applications 4
シリーズ名:
ECS transactions
シリーズ巻号:
16(4)
発行年:
2007
開始ページ:
349
終了ページ:
354
総ページ数:
6
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566776509 [1566776503]
言語:
英語
請求記号:
E23400/11-4
資料種別:
国際会議録

類似資料:

M. Pemble, I. Povey, F. Chalvet

Electrochemical Society

Gladfelter, Wayne L., Simmonds, Michael G., Zazzera, Larry A., Evans, John F.

MRS - Materials Research Society

Martin, P.A., Holdsworth, R.J., Davis, M., Pemble, M.F., Sheel, D.

Electrochemical Society

Pemble, M.

Electrochemical Society

O'Mahony, C., Hill, M., Mathewson, A.

SPIE-The International Society for Optical Engineering

Pilling,M.J., Nurhayati, Gardner,P., Awalludin,A., Pemble,M.E., Surman,M.

SPIE - The International Society for Optical Engineering

Kevin Seibert, Carla Luciani, Colm O'Mahony

American Institute of Chemical Engineers

Wang, Y., Dai, M., Rivilon, S., Ho, M.-T., Chabal, Y. J.

SPIE - The International Society of Optical Engineering

Kevin Seibert, Carla Luciani, Colm O'Mahony

American Institute of Chemical Engineers

D. O'Mahony, I. Mathews, A. Gocalinska

ESA Communications

Clarke, C.L., Boag, N.M., Pemble, M.E.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12