1.

国際会議録
国際会議録
1. Knowledge-based very large scale integration (VLSI) process diagnostic system
M.E. Parten ; M. Kittappa ; F.R. Zapata
出版情報: Manufacturing process control for microelectronic devices and circuits : 20-21 October 1994, Austin, Texas.  pp.63-69,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2336
2.

国際会議録
国際会議録
2. Robotics projects for the undergraduate electrical engineering design lab
D.J. Mehrl ; M.E. Parten ; S. Mitra
出版情報: Intelligent robots and computer vision XIV : Algorithms, techniques, active vision, and materials handling : 23-26 October 1995 Philadelphia, Pennsylvania.  pp.48-52,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2588