1.

国際会議録
国際会議録
1. Enhanced Dielectric Constant of HfO₂ and Al₂O₃ Thin-Films with Silver Nanoparticles
K. Ravindran ; M. Othman ; M. Yun ; N. Biswas ; N. Mehta ; S. Guha ; K. Gangopadhyay ; S. Gangopadhyay
出版情報: Physics and technology of high-k gate dielectrics 4.  pp.535-544,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 3(3)
2.

国際会議録
国際会議録
2. Tunable superresolution in the super high-density optical storage
M. Yun ; M. Wang ; W. Kong
出版情報: Quantum optics, optical data storage, and advanced microlithography : 12-14 November 2007, Beijing, China.  pp.68271F-1-68271F-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6827
3.

国際会議録
国際会議録
3. High diffraction efficiency for multi-layer dielectric gratings with rectangular groove
W. Kong ; M. Yun ; C. Ling ; X. Sun ; J. Shao
出版情報: Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China.  pp.69843T-1-69843T-5,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6984
4.

国際会議録
国際会議録
4. Rigorous coupled-wave analysis for the optical character of multi-layer dielectric thin film
W. Kong ; C. Ling ; M. Yun ; X. Sun ; J. Shao
出版情報: Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China.  pp.69843U-1-69843U-4,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6984