1.

国際会議録
国際会議録
1. Radiation-Induced Trapped Charging Effects in SiC Power MOSFETs
R. Green ; A. Lelis ; D. Urciuoli ; M. Litz ; J. Carroll
出版情報: Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan.  pp.533-536,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 778-780
2.

国際会議録
国際会議録
2. Front and back side processed unintentionally doped GaAs Schottky detectors for X-ray detection
F. Semendy ; S. Singh ; M. Litz ; P. Wijewarnasuriya ; K. Blaine
出版情報: Ultrafast X-ray sources and detectors : 26-27 August 2007, San Diego, California, USA.  pp.67031N-1-67031N-9,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6703