1.

国際会議録
国際会議録
1. SoC variability evaluation and reduction
A. P. Balasinski ; M. C. Smayling ; V. Axelrad
出版情報: Microelectronics : design, technology, and packaging III : 5-7 December 2007, Canberra, Australia.  pp.67980I-1-67980I-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6798
2.

国際会議録
国際会議録
2. Low-k1 logic design using gridded design rules
M. C. Smayling ; H. Liu ; L. Cai
出版情報: Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA.  pp.69250B-1-69250B-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6925
3.

国際会議録
国際会議録
3. APF pitch-halving for 22nm logic cells using gridded design rules
M. C. Smayling ; C. Bencher ; H. D. Chen ; H. Dai ; M. P. Duane
出版情報: Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA.  pp.69251E-1-69251E-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6925