1.

国際会議録
国際会議録
1. Machine vision for solar cell characterization
Ordaz,M.A. ; Lush,G.B.
出版情報: Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California.  pp.238-248,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3966
2.

国際会議録
国際会議録
2. Characterization and Analysis of CdS-CdTe Junctions in Thin Film Solar Cells using Various Deposition Techniques for Cds and CdTe
Linam,D.L. ; Singh,V.P. ; Dils,D.W. ; McClure,J.C. ; Lush,G.B.
出版情報: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.1258-1261,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3975