Rare-earth-doped devices II : 26-27 January 1998, San Jose, California. pp.40-45, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Rare-earth-doped devices II : 26-27 January 1998, San Jose, California. pp.2-13, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Rare-earth-doped materials and devices IV : 26-27 January 2000, San Jose, California. pp.166-173, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts. pp.56-62, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California. pp.58-65, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California. pp.10-18, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California. pp.122-128, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering