Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs
- 著者名:
Lukyanchikova, N. R. ( Institute of Semiconductor Physics (Ukraine) ) Garbar, N. ( Institute of Semiconductor Physics (Ukraine) ) Smolanka, A. ( Institute of Semiconductor Physics (Ukraine) ) Simoen, E. ( IMEC (Belgium) ) Mercha, A. ( IMEC (Belgium) ) Claeys, C. ( IMEC (Belgium) and Katholieke Univ. Leuven (Belgium) ) - 掲載資料名:
- Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5470
- 発行年:
- 2004
- 開始ページ:
- 208
- 終了ページ:
- 214
- 総ページ数:
- 7
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453969 [081945396X]
- 言語:
- 英語
- 請求記号:
- P63600/5470
- 資料種別:
- 国際会議録
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