1.

国際会議録
国際会議録
1. Upgrades to the NIST/DARPA EUV reflectometry facility
Tarrio,C. ; Lucatorto,T.B. ; Grantham,S. ; Squires,M.B. ; Arp,U. ; Deng,L.
出版情報: Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA.  pp.32-38,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4506
2.

国際会議録
国際会議録
2. New infrared beamline at the NIST SURF II storage ring
Hight Walker,A.R. ; Arp,U. ; Fraser,G.T. ; Lucatorto,T.B. ; Wen,J.
出版情報: Accelerator-based infrared sources and applications : 29-30 July 1997, San Diego, California.  pp.42-50,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3153
3.

国際会議録
国際会議録
3. NIST programs for calibrations in the far-ultraviolet spectral region
Vest,R.E. ; Canfield,L.R. ; Furst,M.L. ; Graves,R.M. ; Hamilton,A.D. ; Hughey,L.R. ; Lucatorto,T.B. ; Madden,R.P.
出版情報: Ultraviolet atmospheric and space remote sensing : methods and instrumentation II : 22 July 1999, Denver, Colorado.  pp.15-26,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3818
4.

国際会議録
国際会議録
4. Novel x-ray mask inspection tool based on transmission x-ray conversion microscope
Liang,S.T. ; Cerrina,F. ; Lucatorto,T.B.
出版情報: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI : 11-13 March 1996, Santa Clara, California.  pp.211-220,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2723