Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA. pp.125-131, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia technology III : 15-17 October, 2002, Shanghai, China. pp.622-630, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Luscombe, C.K. ; Huck, W.T.S. ; Holmes, A.B. ; Lu, T. ; Leeke, G.A. ; Santos, R.C.D. ; Al-Duri, B. ; Seville, J.P.K.
出版情報:
Polymer/metal interfaces and defect mediated phenomena in ordered polymers : symposia held December 2-6, 2002, Boston, Massachusetts, U.S.A.. pp.103-216, 2003. Warrendale, Pa.. Materials Research Society
Zhou, C. ; Cotton, T.M. ; Qu, X. ; Lu, T. ; Dong, S.
出版情報:
Proceedings of the fifth International Symposium on Redox Mechanisms and Interfacial Properties of Molecules of Biological Importance 1993. pp.63-74, 1993. Pennington, NJ. Electrochemical Society
Zhou, C. ; Cotton, T.M. ; Qu, X. ; Lu, T. ; Dong, S.
出版情報:
Proceedings of the fifth International Symposium on Redox Mechanisms and Interfacial Properties of Molecules of Biological Importance 1993. pp.56-62, 1993. Pennington, NJ. Electrochemical Society
Proceedings of the fifth International Symposium on Redox Mechanisms and Interfacial Properties of Molecules of Biological Importance 1993. pp.135-143, 1993. Pennington, NJ. Electrochemical Society
Hsu, C. ; Lee, H. ; Liang, K.S. ; Jeng, U. ; Windover, D. ; Lu, T. ; Jin, C.
出版情報:
Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.. pp.D5.23-, 2001. Warrendale, PA. Materials Research Society
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