1.

国際会議録
国際会議録
1. Dopant Mapping and Strain Analysis B Doped Silicon Structures Using Micro-Raman Spectroscopy
Bowden, M. ; Gardiner, D. J. ; Lourenco, M. A. ; Hedley, J. ; Wood, D. ; Burdess, J. S. ; Harris, A. J.
出版情報: Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A..  pp.239-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 518
2.

国際会議録
国際会議録
2. The effect of annealing on argon implanted edge terminations for 4H-SiC schottky diodes
Knights, A. P. ; Morrison, D. J. ; Wright, N. G. ; Johnson, C. M. ; O'Neill, A. G. ; Ortolland, S. ; Homewood, K. P. ; Lourenco, M. A. ; Gwilliam, R. M. ; Coleman, P. G.
出版情報: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.129-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 572
3.

国際会議録
国際会議録
3. Structures and light emission properties of ion beam synthesized FeSi2 in silicon
Chow, C. F. ; Gao, Y. ; Wang, S. P. ; Ke, N. ; Li, Q. ; Cheung, W. Y. ; Shao, G. ; Lourenco, M. A. ; Homewood, K. P.
出版情報: Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II.  pp.17-22,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5650