1.

国際会議録
国際会議録
1. Analysis of complex structures using a 3D x-ray tomography system with microfocus tube
Lopes,R.T. ; Oliveria,L.F.de ; Jesus,E.F.Oliveira de ; Brazd,D.
出版情報: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.213-221,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4503
2.

国際会議録
国際会議録
2. X- and Y-ray tomography for nondestructive material testing
Cesareo,R. ; Brunetti,A. ; Lopes,R.T. ; Galli,G. ; Rao,D.V. ; Castellano,A. ; Gigante,G.E. ; Mascarenhas,S. ; Robert,R. ; Filho,V.S. ; Gilardoni,M. ; Silva,H.P.Da ; Colosso,P.Q.
出版情報: Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado.  pp.292-303,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3772
3.

国際会議録
国際会議録
3. Measurements of differential cross-section for x-ray diffraction in amorphous materials using synchrotron radiation
Barroso,R.C. ; Lopes,R.T. ; Jesus,E.F.O.de ; Oliveria,L.F.de ; Anjos,M.J.
出版情報: Penetrating Radiation Systems and Applications II.  pp.101-107,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4142
4.

国際会議録
国際会議録
4. Scattered radiation from radiographic intensifying screen: a Monte Carlo simulation
Barroso,R.C. ; Braz,D. ; Anjos,M.J. ; Lopes,R.T. ; Castro,C.R.F.de
出版情報: Penetrating Radiation Systems and Applications III.  pp.188-192,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4508