1.

国際会議録
国際会議録
1. Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)
Weikle II, R. M. ; Liu, Z. ; Liu, H. ; Liu, L. ; Ulker, S. ; Lichtenberger, A. W.
出版情報: Nanofabrication: Technologies, Devices, and Applications.  pp.328-340,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5592
2.

国際会議録
国際会議録
2. The reduced order optimum method for the placement and control law design of control devices between two adjacent structures
Teng, J. ; Liu, H.
出版情報: Smart structures and materials 2005 : Damping and isolation : 7-10 March 2005, San Diego, California, USA.  pp.538-549,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5760
3.

国際会議録
国際会議録
3. Reconfiguration of virtual topology on wavelength-routed optical ring networks with dynamic traffic
Chen, C. ; Liu, H. ; Fan, G.
出版情報: Network Architectures, Management, and Applications II.  pp.1105-1115,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5626
4.

国際会議録
国際会議録
4. Design of physical and logical topologies with fault-tolerant ability in wavelength-routed optical network
Chen, C. ; Liu, H. ; Fan, G.
出版情報: Network Architectures, Management, and Applications II.  pp.1028-1036,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5626
5.

国際会議録
国際会議録
5. Toward robust AV conferencing on next-generation networks
Liu, H. ; Cheng, L. ; Zarki, M. El
出版情報: Multimedia Computing and Networking 2005.  pp.91-102,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5680
6.

国際会議録
国際会議録
6. A novel aspheric surface testing method using part-compensating lens
Liu, H. ; Hao, Q. ; Zhu, Q. ; Sha, D. ; Zhang, C.
出版情報: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.324-329,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5638
7.

国際会議録
国際会議録
7. Detection of damaged forest by tomicus piniperda using multiple types of remote sensing data
Dong, X. ; Feng, X. ; Zhao, S. ; Yang, X. ; Liu, H. ; Xu, H. ; Ke, Y.
出版情報: Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA.  pp.559-566,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5655
8.

国際会議録
国際会議録
8. Power loss of X-junction in solid state optical gyrometer simulated by beam propagation method
Zhang, T. ; Liu, H. ; Qian, Y. S. ; Cui, Y. P.
出版情報: Optoelectronic Devices and Integration.  pp.479-482,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5644
9.

国際会議録
国際会議録
9. Near-infrared reflectance spectroscopy as a novel method to detect demyelination in rat sciatic nerve in vivo
Radhakrishnan, H. ; Senapati, A. ; Peng, Y. B. ; Kashyap, D. ; Liu, H.
出版情報: Photonic Therapeutics and Diagnostics.  pp.477-486,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5686
10.

国際会議録
国際会議録
10. Reflector optimal design for segmented reflector lamp
Liu, H. ; Pan, B.
出版情報: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.97-102,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5638