1.

国際会議録
国際会議録
1. Atomic Scale Characterization of Supported and Assembled Nanoparticles
Pauwels, B. ; Yandouzi, M. ; Schryvers, D. ; Tendeloo, G. Van ; Verschoren, G. ; Lievens, P. ; Hou, M. ; Swygenhoven, H. Van
出版情報: Structure and mechanical properties of nanophase materials--theory and computer simulation vs. experiment : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 634
2.

国際会議録
国際会議録
2. Atomic Scale Modelling of Supported and Assembled Nanoparticles
Zhurkin, E. ; Hou, M. ; Swygenhoven, H. Van ; Pauwels, B. ; Yandouzi, M. ; Schryvers, D. ; Tendeloo, G. Van ; Lievens, P. ; Verschoren, G. ; Kuriplach, J. ; Peteghem, S. Van ; Segers, D. ; Dauwe, C.
出版情報: Structure and mechanical properties of nanophase materials--theory and computer simulation vs. experiment : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 634
3.

国際会議録
国際会議録
3. Double-resonance photo-ionization of metal atoms: a sensitive probe of electronic processes during sputtering
Bastiaansen, J. ; Vandeweert, E. ; Lievens, P. ; Silverans, R.E.
出版情報: 19th Congress of the International Commission for Optics: Optics for the Quality of Life.  pp.541-543,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4829