1.

国際会議録
国際会議録
1. X-RAY DIFFRACTION AND REFLECTANCE, RAMAN SCATTERING AND PHOTOLUMINESCENCE CHARACTERIZATION OF THERMALLY ANNEALED EPITAXIAL Si1-XGeX LAYERS
Libezny, M. ; De WoIf, I. ; Poortmans, J. ; Van Ammel, A. ; Caymax, M. ; Holy, V. ; Vi-da, F. ; Kub-na, J. ; Werner, K. ; Ishida, M.
出版情報: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.51-56,  1993.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 298
2.

国際会議録
国際会議録
2. PL study of oxygen related defects in silicon
Libezny, M. ; Kaniava, A. ; Kissinger, G. ; Nijs, J. ; Claeys, C. ; Vanhellemont, J.
出版情報: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.165-172,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-30
3.

国際会議録
国際会議録
3. STUDY OF THE TRANSVERSAL ELECTRON MOBILITY IN HETEROJUNCTION BIPOLAR TRANSISTORS WITH STRAINED Si1-XGeX -BASE
Poortmans, J. ; Caymax, M. ; Van Ammel, A. ; Libezny, M. ; Nijs, J.
出版情報: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.409-414,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 281
4.

国際会議録
国際会議録
4. Morphologies and Growth Modes of FeSi and β-FeSi2 Layers Prepared by Rapid Thermal Annealing
Amesz, P. H. ; Jorgensen, L. V. ; Libezny, M. ; Poortmans, J. ; Nijs, J. ; Veen, A. van ; Schut, H. ; Hosson, J. Th. M. de
出版情報: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.373-,  1996.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 402
5.

国際会議録
国際会議録
5. RTA-Preparation of β-FeSi2 Layers From MBE-Grown Fe-Si Films Deposited on Si and Relaxed SiGe (100) Substrates
Libezny, M. ; Poortmans, J. ; Dekoster, J. ; Degroote, S. ; Vantomme, A. ; Lange, B. G. M. De ; Langouche, G. ; Nijs, J.
出版情報: Rapid thermal and integrated processing IV : symposium held April 17-20, 1995, San Francisco, California, U.S.A..  pp.407-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 387
6.

国際会議録
国際会議録
6. On the Recombination Activity of Oxygen Precipitation Related Lattice Defects in Silicon
Vanhellemont, J. ; Kaniava, A. ; Libezny, M. ; Simoen, E. ; Kissinger, G. ; Gaubas, E. ; Claeys, C. ; Clauws, P.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.35-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378
7.

国際会議録
国際会議録
7. Structural and Electrical Characterization of FeSix-Layers (1｡蛉｡？) Prepared by RTP of Fe Layers Sputtered on Si (100)
Libezny, M. ; Poortmans, J. ; Amesz, P. H. ; Donaton, R. A. ; Larsen, K. Kyllesbech ; Vandenabeele, P. ; Jonckx, F. ; Maex, K. ; Nijs, J.
出版情報: Rapid thermal and integrated processing IV : symposium held April 17-20, 1995, San Francisco, California, U.S.A..  pp.389-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 387